Search/CVE-2018-11279
CVE — High

CVE-2018-11279

Lack of check of input size can make device memory get corrupted because of buffer overflow in snapdragon automobile, snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, MDM9615, MDM9625, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 810, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM439, SDM630, SDM660, SDX20, Snapdragon_High_Med_2016, SXR1130

CVSS v3.1
8.8 HIGH
EPSS
0.51%
probability of exploitation in 30 days
CISA KEV
Not listed
no confirmed exploitation reported
News coverage
0
sources referencing this CVE
EPSS Trend
Aug 16, 2026Sep 7, 2026
0.00pp
0.51% → 0.51% over 7 tracked changes
CVSS v3.1 Detail
Attack VectorADJACENT
Attack ComplexityLOW
Privileges RequiredNONE
User InteractionNONE
ScopeUNCHANGED
ConfidentialityHIGH
IntegrityHIGH
AvailabilityHIGH
CVSS:3.0/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
Connections
26 relationships
Timeline
disclosure → media coverage
Jan 18, 2019
Disclosure — published as a CVE record. · last revised by NVD Nov 21, 2024